• TDI Cameras for Semiconductor Metrology & Inspection

    TDI (Time Delay Integration) line scan cameras feature high sensitivity and ultra-high line rate, widely adopted for wafer & photomask defect inspection in semiconductor metrology. Domestic brands have mass-produced 100Gbps TDI cameras. StarTest’s PCIe-3004 fiber frame grabber with RDMA distribution platform cuts hardware cost and transmission latency for high-speed image streaming.

    넶2 2026-07-26

  • Hand in Hand for Progress, Embark on a Smart New Semiconductor Journey — Xinkailai Visits Star Test Electronics for Inspection & Exchange

    In early July, Xinkailai Technology's senior engineers visited StarTest Electronics for in-depth exchanges on image acquisition/processing technologies in semiconductor wafer metrology. StarTest's self-developed 100G high-speed image transmission solution has been applied to leading domestic semiconductor equipment manufacturers, and it will continue to focus on high-end semiconductor inspection to boost the independent innovation of domestic equipment.

    넶13 2026-07-15

  • FPGA PCIe P2P Communication: Implementing GPU Direct RDMA

    This document presents Xingce Electronics’ FPGA PCIe P2P GPU Direct RDMA solution. It supports direct data transfer between FPGA and GPU memory without CPU intermediate copying, which reduces end-to-end latency, improves effective bandwidth and fully offloads CPU workloads. Comprehensive functional and 12-hour stability tests are finished on Tegra Orin, H100 and RTX A4000 platforms, with complete measured performance data and step-by-step integration tutorials attached.

    넶54 2026-07-08

  • Test Performance of GPU Direct DMA RDMA and FPGA Communication on Jetson Platform

    This paper tests and analyzes the communication performance of GPU Direct DMA RDMA and FPGA on the Jetson platform. Compared with traditional transmission paths, it verifies that this technology can reduce data read/write latency by about 50% and achieve a bandwidth of 2.84GB/s (close to the theoretical upper limit of PCIe Gen3 x4), with no performance degradation in a 12-hour long-term stability test, and provides technical selection suggestions for different scenarios.

    넶15 2026-07-05